<?xml version="1.0"?>
<records>
  <record>
    <language>eng</language>
    <publisher>Ansari Education and Research Society</publisher>
    <journalTitle>Journal of Ultra Scientist of Physical Sciences</journalTitle>
    <issn/>
    <eissn/>
    <publicationDate>December 2010</publicationDate>
    <volume>22</volume>
    <issue>3</issue>
    <startPage>556</startPage>
    <endPage>566</endPage>
    <doi>juc</doi>
    <publisherRecordId>929</publisherRecordId>
    <documentType>article</documentType>
    <title language="eng">Structural and Dieletric Properties of Some Tungstate Compounds</title>
    <authors>
      <author>
        <name>A. N. Thakur</name>
        <affiliationId>1</affiliationId>
      </author>
      <author>
        <name>K.C. Maurya</name>
        <affiliationId>1</affiliationId>
      </author>
      <author>
        <name>S.K. Yadav</name>
        <affiliationId>1</affiliationId>
      </author>
    </authors>
    <affiliationsList>
      <affiliationName affiliationId="1">Department of Physics, T.D.P.G., College, Jaunpur - 222002, UP (INDIA</affiliationName>
    </affiliationsList>
    <abstract language="eng">&lt;p style="text-align: justify;"&gt;The tungstate compounds Ce&lt;sub&gt;2&lt;/sub&gt;(WO&lt;sub&gt;4&lt;/sub&gt;)&lt;sub&gt;3&lt;/sub&gt;, Dy&lt;sub&gt;2&lt;/sub&gt;(WO&lt;sub&gt;4&lt;/sub&gt;)&lt;sub&gt;3&lt;/sub&gt;, Ho&lt;sub&gt;2&lt;/sub&gt;(WO&lt;sub&gt;4&lt;/sub&gt;)&lt;sub&gt;3&lt;/sub&gt;, Er&lt;sub&gt;2&lt;/sub&gt;(WO&lt;sub&gt;4&lt;/sub&gt;)&lt;sub&gt;3&lt;/sub&gt; and Yb&lt;sub&gt;2&lt;/sub&gt;(WO&lt;sub&gt;4&lt;/sub&gt;)&lt;sub&gt;3 &lt;/sub&gt;have been synthesized by the solid state reaction technique. The synthesized compounds have been characterised by XRD, DTA, TGA and DTG. XRD patterns show them to be orthorhombic. Dielectric constant (K&amp;acute;) and Dielectric loss (K&amp;acute;&amp;acute;) of these compounds have been measured at 1 KHz in the temperature range 303 to 1103 K. The studied compounds have relatively high value of dielectric constant and low value of dielectric loss around 400K.&lt;br /&gt;&#xD;
&amp;nbsp;&lt;/p&gt;&#xD;
</abstract>
    <fullTextUrl format="html">https://ultraphysicalsciences.org/paper/929/</fullTextUrl>
    <keywords>
      <keyword language="eng">Dielectric constant</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">dielectric loss</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">TGA</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">XRD</keyword>
    </keywords>
  </record>
</records>
