The present study focus on the structural and physical studies of chalcopyrite (CuFeS₂) samples in Laboratory. The sample has been characterized by X-ray diffraction technique and revealed that the sample is possesses tetragonal crystal structure with chalcopyrite structure and preferred orientation along (112) plane with the space group I 4 2d and point group 4 2m. The value of lattice parameter a and c for the sample is found to be 5.293 ºA and 10.423 ºA respectively. The d.c. electrical resistivity measurement have been carried out over temperature range of 300° to 800°K. The temperature dependence of electrical resistivity exhibited two activation energies. The magnetic susceptibility value is found to be 41.75 x 10^-8m³kg^-1 (S.I.unit). These values are compared with the standard data and showed that the sample is having tetragonal system structure, semiconductor behavior and paramagnetic which become ferromagnetic after applied external field.